Study of genetic variability, correlation and path analysis in Indian mustard (Brassica juncea L.) for yield components

Abstract

Analysis of data on 10 characters on 30 wheat genotypes. The wide range of different characters and comparison of mean of germplasm lines using least significant differences indicated existence of very high degree of variability for all the characters in the germplasm collection evaluated. Seed yield per plant showed very strong positive association with No. of primary branches, No. of secondary branches, no. of siliqua/ plant, Silqua length, Seeds per siliqua and 1000-seed weight (g). Most of the characters showing significant positive correlation with grain yield per plant such as No. of primary branches, No. of secondary branches, no. of siliqua/ plant, Silqua length, Seeds per siliqua and 1000-seed weight (g) were also positively correlated among themselves. Existence of significant positive associations among yield and important yield components suggested that selection would be highly effective and efficient in improving these traits due to possibility of correlated response. Path analysis identified, plant height, days to maturity, days to 50% flowering, no. of siliqua/ plant, Silqua length, Seeds per siliqua thousand seed weight and no. of secondary branches/plant as major direct contributor towards expression of grain yield per plant. The character identified above as important direct and indirect yield components merit due to consideration in formulating effective selection strategy for developing high yielding varieties in mustard.